The Tunable Narrowband Low Coherence Source is based on Multiwave’s all-fiber technology design, and offers (1) linearly polarized output with high Polarization Extinction Ratio (PER>20dB), (2) a narrow spectral linewidth (0.1 to 4 nm) resulting in short coherence lengths (5 to 0.1 mm), dramatically reducing speckle and interference from multiple reflections, (3) a high spectral brightness (>15 mW/nm) in a diffraction limited, fiber-coupled output beam, that can be tightly focused, (4) fine tuning of the center wavelength to allow precise spectral matching to laser sources, an important feature in applications where results are wavelength dependent, (5) exceptional stability in power, optical spectrum, and spectral shape with changes in ambient temperature, critical for quantitative measurements, and (6) CW or fast AM operation (with 15 ns rise and fall times).

 

This optical source is the ideal laser replacement for high resolution industrial imaging and semiconductor diagnostic probing equipment, such as (1) Laser Voltage Probing (LVP), a non-contact through-silicon technique for measuring electrical activity inside ICs, (2) Polarization Difference Probing (PDP), (3) Laser Assisted Device Alteration (LADA), (4) Laser Induced Voltage Alteration (LIVA) and (5) Soft Defect Localization (SDL).

 

As an option, this source can also incorporate a broadband output through the same output fiber, and narrowband / broadband outputs can be electrically switched by an external TTL signal.